Journal abbreviation: Electronic device failure analysis

The abbreviation of the journal title "Electronic device failure analysis" is "Electron. Device Fail. Anal.". It is the recommended abbreviation to be used for abstracting, indexing and referencing purposes and meets all criteria of the ISO 4 standard for abbreviating names of scientific journals.

Abbreviation rules

The table below outlines in detail the ISO 4 rules and matches to the ISSN maintained list of title word abbreviations (TWA) to derive the abbreviation.

ElectronicElectron.matches the stem "electroni-"
deviceDeviceNo abbreviation listed in TWA.
failureFail.matches the word "failure"
analysisAnal.matches the stem "analys-"

About the journal

Full journal titleElectronic device failure analysis
AbbreviationElectron. Device Fail. Anal.
ISSN (print)1537-0755
ISSN (online)2304-8115
NLM catalogNA

Other journal abbreviations