Journal abbreviation: Electronic device failure analysis

The abbreviation of the journal title "Electronic device failure analysis" is "Electron. Device Fail. Anal.". It is the recommended abbreviation to be used for abstracting, indexing and referencing purposes and meets all criteria of the ISO 4 standard for abbreviating names of scientific journals.

Abbreviation rules

The table below outlines in detail the ISO 4 rules and matches to the ISSN maintained list of title word abbreviations (TWA) to derive the abbreviation.

ElectronicElectron.matches the stem "electroni-"
deviceDeviceNo abbreviation listed in TWA.
failureFail.matches the word "failure"
analysisAnal.matches the stem "analys-"

Abbreviation systems

ISO 4 abbreviation is a system established by the International Organization for Standardization, specifically for shortening journal titles. This uniform approach to abbreviations enables efficient and accurate communication of journal names in academic research.

ISO, standing for International Organization for Standardization, is a universal abbreviation system for journal titles across disciplines. NLM, or National Library of Medicine, is specific to biomedical sciences, and CASSI, the CAS Source Index, caters to chemistry-related disciplines.

About the journal

Full journal titleElectronic device failure analysis
AbbreviationElectron. Device Fail. Anal.
ISSN (print)1537-0755
ISSN (online)2304-8115
NLM catalogNA

Other journal abbreviations