Journal abbreviation: Electronic device failure analysis
The abbreviation of the journal title "Electronic device failure analysis" is "Electron. Device Fail. Anal.". It is the recommended abbreviation to be used for abstracting, indexing and referencing purposes and meets all criteria of the ISO 4 standard for abbreviating names of scientific journals.
The table below outlines in detail the ISO 4 rules and matches to the ISSN maintained list of title word abbreviations (TWA) to derive the abbreviation.
|Electronic||Electron.||matches the stem "electroni-"|
|device||Device||No abbreviation listed in TWA.|
|failure||Fail.||matches the word "failure"|
|analysis||Anal.||matches the stem "analys-"|
ISO 4 abbreviation is a system established by the International Organization for Standardization, specifically for shortening journal titles. This uniform approach to abbreviations enables efficient and accurate communication of journal names in academic research.
ISO, standing for International Organization for Standardization, is a universal abbreviation system for journal titles across disciplines. NLM, or National Library of Medicine, is specific to biomedical sciences, and CASSI, the CAS Source Index, caters to chemistry-related disciplines.
About the journal
|Full journal title||Electronic device failure analysis|
|Abbreviation||Electron. Device Fail. Anal.|