Journal abbreviation: Electronic device failure analysis
The abbreviation of the journal title "Electronic device failure analysis" is "Electron. Device Fail. Anal.". It is the recommended abbreviation to be used for abstracting, indexing and referencing purposes and meets all criteria of the ISO 4 standard for abbreviating names of scientific journals.
Abbreviation rules
The table below outlines in detail the ISO 4 rules and matches to the ISSN maintained list of title word abbreviations (TWA) to derive the abbreviation.
| Title | Abbreviation | Word/Stem/Rule |
|---|---|---|
| Electronic | Electron. | matches the stem "electroni-" |
| device | Device | No abbreviation listed in TWA. |
| failure | Fail. | matches the word "failure" |
| analysis | Anal. | matches the stem "analys-" |
Abbreviation systems
An ISO 4 abbreviation refers to a standardized method for abbreviating journal titles as defined by the International Organization for Standardization. This system ensures consistency and easy identification of journal titles across various databases and citation formats.
The abbreviation of journal titles follows ISO (International Organization for Standardization) for an array of subjects, NLM (National Library of Medicine) for biomedical sciences, and CASSI (CAS Source Index) for chemistry and related disciplines.
About the journal
| Full journal title | Electronic device failure analysis |
|---|---|
| Abbreviation | Electron. Device Fail. Anal. |
| ISSN (print) | 1537-0755 |
| ISSN (online) | 2304-8115 |
| NLM catalog | NA |