Journal abbreviation: Electronic device failure analysis
The abbreviation of the journal title "Electronic device failure analysis" is "Electron. Device Fail. Anal.". It is the recommended abbreviation to be used for abstracting, indexing and referencing purposes and meets all criteria of the ISO 4 standard for abbreviating names of scientific journals.
Abbreviation rules
The table below outlines in detail the ISO 4 rules and matches to the ISSN maintained list of title word abbreviations (TWA) to derive the abbreviation.
| Title | Abbreviation | Word/Stem/Rule |
|---|---|---|
| Electronic | Electron. | matches the stem "electroni-" |
| device | Device | No abbreviation listed in TWA. |
| failure | Fail. | matches the word "failure" |
| analysis | Anal. | matches the stem "analys-" |
Abbreviation systems
In academic research, the ISO 4 abbreviation is a standardized system devised by the International Organization for Standardization for the purpose of abbreviating journal titles consistently. This facilitates ease of reference and improved communication within the research community.
Journal title abbreviations can be classified into ISO (International Organization for Standardization) for general disciplines, NLM (National Library of Medicine) for biomedical and life sciences, and CASSI (CAS Source Index) for chemistry and related fields.
About the journal
| Full journal title | Electronic device failure analysis |
|---|---|
| Abbreviation | Electron. Device Fail. Anal. |
| ISSN (print) | 1537-0755 |
| ISSN (online) | 2304-8115 |
| NLM catalog | NA |