Journal abbreviation: Electronic device failure analysis
The abbreviation of the journal title "Electronic device failure analysis" is "Electron. Device Fail. Anal.". It is the recommended abbreviation to be used for abstracting, indexing and referencing purposes and meets all criteria of the ISO 4 standard for abbreviating names of scientific journals.
Abbreviation rules
The table below outlines in detail the ISO 4 rules and matches to the ISSN maintained list of title word abbreviations (TWA) to derive the abbreviation.
| Title | Abbreviation | Word/Stem/Rule |
|---|---|---|
| Electronic | Electron. | matches the stem "electroni-" |
| device | Device | No abbreviation listed in TWA. |
| failure | Fail. | matches the word "failure" |
| analysis | Anal. | matches the stem "analys-" |
Abbreviation systems
The International Organization for Standardization has developed the ISO 4 abbreviation system as a means of creating uniform abbreviations for journal titles. This allows researchers and academics to easily recognize and refer to journals in a consistent manner.
ISO, standing for International Organization for Standardization, is a universal abbreviation system for journal titles across disciplines. NLM, or National Library of Medicine, is specific to biomedical sciences, and CASSI, the CAS Source Index, caters to chemistry-related disciplines.
About the journal
| Full journal title | Electronic device failure analysis |
|---|---|
| Abbreviation | Electron. Device Fail. Anal. |
| ISSN (print) | 1537-0755 |
| ISSN (online) | 2304-8115 |
| NLM catalog | NA |