Journal abbreviation: Electronic device failure analysis
The abbreviation of the journal title "Electronic device failure analysis" is "Electron. Device Fail. Anal.". It is the recommended abbreviation to be used for abstracting, indexing and referencing purposes and meets all criteria of the ISO 4 standard for abbreviating names of scientific journals.
Abbreviation rules
The table below outlines in detail the ISO 4 rules and matches to the ISSN maintained list of title word abbreviations (TWA) to derive the abbreviation.
| Title | Abbreviation | Word/Stem/Rule |
|---|---|---|
| Electronic | Electron. | matches the stem "electroni-" |
| device | Device | No abbreviation listed in TWA. |
| failure | Fail. | matches the word "failure" |
| analysis | Anal. | matches the stem "analys-" |
Abbreviation systems
Developed by the International Organization for Standardization, the ISO 4 abbreviation system provides a standardized way of abbreviating journal titles. This consistency enables researchers to efficiently identify and cite journals in their work.
ISO, or International Organization for Standardization, is a journal title abbreviation system for multiple fields. NLM (National Library of Medicine) abbreviations are used in biomedical sciences, while CASSI (CAS Source Index) abbreviations apply to chemistry and associated fields.
About the journal
| Full journal title | Electronic device failure analysis |
|---|---|
| Abbreviation | Electron. Device Fail. Anal. |
| ISSN (print) | 1537-0755 |
| ISSN (online) | 2304-8115 |
| NLM catalog | NA |